The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film

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dc.authorscopusid16029234400
dc.authorscopusid16028137400
dc.authorscopusid55693651100
dc.authorscopusid6603478924
dc.contributor.authorKoçahan, Özlem
dc.contributor.authorCoşkun, E.
dc.contributor.authorTiryaki, Erhan
dc.contributor.authorÖzder, Serhat
dc.date.accessioned2022-05-11T14:03:17Z
dc.date.available2022-05-11T14:03:17Z
dc.date.issued2019
dc.departmentFakülteler, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractThe zero order generalized Morse wavelet was proposed as a method to determine the refractive index and extinction coefficient dispersions of an absorbing thin film in the visible and near infrared regions at room temperature. The generalized Morse wavelet has two degree of freedom and the advantages and disadvantages of additional degree of freedom were discussed in the simulation works. The simulation studies were based on the mean relative error and Cauchy coefficients comparisions, and accuracy of the calculated refractive index was improved by the presented method, were compared with the Morlet wavelet and Paul wavelet. Also, the noise immunity of the method was discussed. The experimental validity of the method was tested on a cadmium sulfide absorbing thin film and the calculated refractive index were cross checked with the value of envelope method and literature. © 2019 Elsevier B.V.
dc.description.sponsorship115F168; Consejo Nacional de Investigaciones Científicas y Técnicas, CONICET
dc.description.sponsorshipThis work was supported by the Turkish Scientific and Technical Research Council (TUBITAK-MFAG no: 115F168 ).
dc.identifier.doi10.1016/j.tsf.2019.01.032
dc.identifier.endpage77
dc.identifier.issn0040-6090
dc.identifier.scopus2-s2.0-85060540511
dc.identifier.scopusqualityQ2
dc.identifier.startpage72
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2019.01.032
dc.identifier.urihttps://hdl.handle.net/20.500.11776/4659
dc.identifier.volume673
dc.identifier.wosWOS:000458272100012
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorKoçahan, Özlem
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofThin Solid Films
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectAbsorbing thin film
dc.subjectExtinction coefficient
dc.subjectGeneralized Morse wavelet
dc.subjectRefractive index
dc.subjectCadmium sulfide
dc.subjectDegrees of freedom (mechanics)
dc.subjectDispersion (waves)
dc.subjectII-VI semiconductors
dc.subjectInfrared devices
dc.subjectSulfur compounds
dc.subjectThin films
dc.subjectDegree of freedom
dc.subjectExtinction coefficients
dc.subjectGeneralized Morse wavelet
dc.subjectMean relative error
dc.subjectSimulation studies
dc.subjectTwo-degree of freedom
dc.subjectVisible and near infrared
dc.subjectWavelet methods
dc.subjectRefractive index
dc.titleThe zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film
dc.typeArticle

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