The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film
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Dosyalar
Tarih
2019
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Elsevier B.V.
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
The zero order generalized Morse wavelet was proposed as a method to determine the refractive index and extinction coefficient dispersions of an absorbing thin film in the visible and near infrared regions at room temperature. The generalized Morse wavelet has two degree of freedom and the advantages and disadvantages of additional degree of freedom were discussed in the simulation works. The simulation studies were based on the mean relative error and Cauchy coefficients comparisions, and accuracy of the calculated refractive index was improved by the presented method, were compared with the Morlet wavelet and Paul wavelet. Also, the noise immunity of the method was discussed. The experimental validity of the method was tested on a cadmium sulfide absorbing thin film and the calculated refractive index were cross checked with the value of envelope method and literature. © 2019 Elsevier B.V.
Açıklama
Anahtar Kelimeler
Absorbing thin film, Extinction coefficient, Generalized Morse wavelet, Refractive index, Cadmium sulfide, Degrees of freedom (mechanics), Dispersion (waves), II-VI semiconductors, Infrared devices, Sulfur compounds, Thin films, Degree of freedom, Extinction coefficients, Generalized Morse wavelet, Mean relative error, Simulation studies, Two-degree of freedom, Visible and near infrared, Wavelet methods, Refractive index
Kaynak
Thin Solid Films
WoS Q Değeri
Q3
Scopus Q Değeri
Q2
Cilt
673
