An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet

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Küçük Resim

Tarih

2021

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Sciendo

Erişim Hakkı

info:eu-repo/semantics/openAccess

Özet

The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm wavelength was analyzed by the Continuous Wavelet Transform (CWT) and the refractive index dispersion was obtained by the mentioned method. In addition, a noisy reflectance spectrum was analyzed to show the advantages of the CWT method. Refractive index dispersions calculated by the Morlet and the Paul wavelet were compared to GMW at the end of the study.

Açıklama

Anahtar Kelimeler

Dielectric film, refractive index, reflectance spectrum, continuous wavelet transform, generalized Morse wavelet, Optical-Constants, Thin-Films, Thickness, Dispersion

Kaynak

Measurement Science Review

WoS Q Değeri

Q3

Scopus Q Değeri

Q3

Cilt

21

Sayı

2

Künye