Simultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform

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dc.authorscopusid57190939805
dc.authorscopusid16028137400
dc.authorscopusid16029234400
dc.authorscopusid6603478924
dc.contributor.authorÖzcan, Seçkin
dc.contributor.authorCoşkun, Emre
dc.contributor.authorKoçahan, Özlem
dc.contributor.authorÖzder, Serhat
dc.date.accessioned2022-05-11T14:03:16Z
dc.date.available2022-05-11T14:03:16Z
dc.date.issued2019
dc.departmentFakülteler, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractThe continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared region. Transmittance spectrums, acquired at two different incident angles, were used for the calculations. By this way refractive index dispersion was obtained without knowing the film thickness. The method was tested with simulated data and experimentally applied to a sample of borosilicate glass. The obtained thickness and refractive index dispersion values were compared to the values obtained by the envelope method and the ones provided by the manufacturer. © 2019 Elsevier B.V.
dc.identifier.doi10.1016/j.tsf.2019.137602
dc.identifier.issn0040-6090
dc.identifier.scopus2-s2.0-85073959167
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2019.137602
dc.identifier.urihttps://hdl.handle.net/20.500.11776/4656
dc.identifier.volume692
dc.identifier.wosWOS:000499678700043
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorKoçahan, Özlem
dc.language.isoen
dc.publisherElsevier B.V.
dc.relation.ispartofThin Solid Films
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectDielectric films
dc.subjectPhysical thickness
dc.subjectRefractive index dispersion
dc.subjectTransmittance spectrum
dc.subjectBorosilicate glass
dc.subjectDielectric films
dc.subjectDispersion (waves)
dc.subjectInfrared devices
dc.subjectWavelet transforms
dc.subjectContinuous Wavelet Transform
dc.subjectEnvelope method
dc.subjectPhysical thickness
dc.subjectRefractive index dispersion
dc.subjectSimultaneous determinations
dc.subjectTransmittance spectra
dc.subjectTransmittance spectrum
dc.subjectVisible and near infrared
dc.subjectRefractive index
dc.titleSimultaneous determination of the thickness and refractive index dispersion of dielectric films by the Paul wavelet transform
dc.typeArticle

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