A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet

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dc.authorid0000-0002-6820-3889
dc.authorid0000-0002-9791-3206
dc.authorscopusid55693651100
dc.authorscopusid16028137400
dc.authorscopusid16029234400
dc.authorscopusid6603478924
dc.authorwosidCoskun, Emre/K-3786-2018
dc.contributor.authorTiryaki, Erhan
dc.contributor.authorCoşkun, Emre
dc.contributor.authorKoçahan, Özlem
dc.contributor.authorÖzder, Serhat
dc.date.accessioned2022-05-11T14:29:32Z
dc.date.available2022-05-11T14:29:32Z
dc.date.issued2017
dc.departmentFakülteler, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description32nd International Physics Congress of Turkish-Physical-Society (TPS) -- SEP 06-09, 2016 -- Bodrum, TURKEY
dc.description.abstractIn this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film The reflectance spectrum was generated theoretically in the range of 0.8333 - 3.3333 mu m wavenumber and it was analyzed with presented method. Obtained refractive index determined from various resolution of Paul wavelet were compared with the input values, and the importance of the tunable resolution with Paul wavelet was discussed briefly. The noise immunity and uncertainty of the method was also studied.
dc.description.sponsorshipTurkish Phys Soc
dc.identifier.doi10.1063/1.4976392
dc.identifier.isbn978-0-7354-1483-9
dc.identifier.issn0094-243X
dc.identifier.scopus2-s2.0-85016000063
dc.identifier.scopusqualityN/A
dc.identifier.urihttps://doi.org/10.1063/1.4976392
dc.identifier.urihttps://hdl.handle.net/20.500.11776/7025
dc.identifier.volume1815
dc.identifier.wosWOS:000435205100048
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorKoçahan, Özlem
dc.language.isoen
dc.publisherAmer Inst Physics
dc.relation.ispartofProceedings of the Turkish Physical Society 32nd International Physics Congress (Tps32)
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectOptical-Constants
dc.subjectThickness
dc.titleA Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet
dc.typeConference Object

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