Temperature effects on optical characteristics of thermally evaporated CuSbSe2 thin films for solar cell applications

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Date

2022

Journal Title

Journal ISSN

Volume Title

Publisher

Elsevier B.V.

Access Rights

info:eu-repo/semantics/closedAccess

Abstract

CuSbSe2 thin film was deposited by co-evaporation of binary CuSe and Sb2Se3 sources. The structural and morphological properties of the deposited thin film were investigated with X-ray diffraction (XRD), scanning electron microscopy (SEM), and energy-dispersive X-ray analysis measurements. XRD pattern indicated that deposited thin film has an orthorhombic crystalline structure with the preferential orientation of (013) direction. SEM image presented that the thin film surface is almost uniform. The optical characteristics of the deposited CuSbSe2 thin film were investigated in detail by performing room temperature Raman, temperature-dependent transmittance spectroscopy, and photoluminescence techniques. Raman spectrum exhibited one mode at around 210 cm?1 associated with Ag vibrational mode. The derivative spectroscopy technique was used to obtain the band gap energy of the films. Temperature dependence of band gap energy was investigated by considering the Varshni model. The rate of change of band gap energy, absolute zero value of gap energy, and Debye temperature were determined as ?1.3 × 10?4 eV/K, 1.21 eV, and 297 ± 51 K, respectively. The photoluminescence spectrum indicated the room temperature direct band gap energy as 1.30 eV. © 2022 Elsevier B.V.

Description

Keywords

CuSbSe2, Optical properties, Thermal evaporation, Thin-film, Antimony compounds, Copper compounds, Energy dispersive X ray analysis, Energy gap, Optical films, Photoluminescence, Photoluminescence spectroscopy, Scanning electron microscopy, Selenium compounds, Solar cells, Temperature distribution, Thermal evaporation, X ray diffraction analysis, Band gap energy, Co-evaporations, Crystalline structure, Electrons energy, Optical characteristics, Solar-cell applications, Structural and morphological properties, Thin-films, X ray diffraction patterns, X- ray diffractions, Thin films

Journal or Series

Optical Materials

WoS Q Value

Q2

Scopus Q Value

Q1

Volume

133

Issue

Citation