The generalized Morse wavelet method to determine refractive index dispersion of dielectric films

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dc.authorid0000-0002-6820-3889
dc.authorscopusid16029234400
dc.authorscopusid57190939805
dc.authorscopusid16028137400
dc.authorscopusid6603478924
dc.authorwosidCoskun, Emre/K-3786-2018
dc.contributor.authorKoçahan, Özlem
dc.contributor.authorÖzcan, Seçkin
dc.contributor.authorCoşkun, Emre
dc.contributor.authorÖzder, Serhat
dc.date.accessioned2022-05-11T14:29:33Z
dc.date.available2022-05-11T14:29:33Z
dc.date.issued2017
dc.departmentFakülteler, Fen Edebiyat Fakültesi, Fizik Bölümü
dc.description.abstractThe continuous wavelet transform (CWT) method is a useful tool for the determination of refractive index dispersion of dielectric films. Mother wavelet selection is an important factor for the accuracy of the results when using CWT. In this study, generalized Morse wavelet (GMW) was proposed as the mother wavelet because of having two degrees of freedom. The simulation studies, based on error calculations and Cauchy Coefficient comparisons, were presented and also the noisy signal was tested by CWT method with GMW. The experimental validity of this method was checked by D263 T schott glass having 100 mu m thickness and the results were compared to those from the catalog value.
dc.description.sponsorshipTurkish Scientific and Technical Research Council (TUBITAK-MFAG) [115F168]
dc.description.sponsorshipThis work was supported by the Turkish Scientific and Technical Research Council (TUBITAK-MFAG no: 115F168).
dc.identifier.doi10.1088/1361-6501/aa5dc4
dc.identifier.issn0957-0233
dc.identifier.issn1361-6501
dc.identifier.issue4en_US
dc.identifier.scopus2-s2.0-85014408423
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1088/1361-6501/aa5dc4
dc.identifier.urihttps://hdl.handle.net/20.500.11776/7034
dc.identifier.volume28
dc.identifier.wosWOS:000395890300001
dc.identifier.wosqualityQ2
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorKoçahan, Özlem
dc.language.isoen
dc.publisherIop Publishing Ltd
dc.relation.ispartofMeasurement Science and Technology
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectdielectric film
dc.subjectrefractive index dispersion
dc.subjectgeneralized Morse wavelet
dc.subjectAnalytic Wavelets
dc.subjectThin-Films
dc.subjectThickness
dc.subjectTransform
dc.titleThe generalized Morse wavelet method to determine refractive index dispersion of dielectric films
dc.typeArticle

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