Growth and Characterization of Stoichiometric Cu2ZnSnS4 Crystal Using Vertical Bridgman Technique
Loading...
Files
Date
2022
Journal Title
Journal ISSN
Volume Title
Publisher
John Wiley and Sons Inc
Access Rights
info:eu-repo/semantics/closedAccess
Abstract
Stoichiometric Cu2ZnSnS4 (CZTS) single phase crystals are successfully grown in a single-zone vertical furnace by Bridgman technique. X-ray diffraction (XRD) and Raman spectroscopy measurements are employed to investigate the structural properties of the grown crystals, which verifies the formation of mono-phase CZTS crystals with kesterite structure. The energy-dispersive X-ray analysis (EDS) indicates the growth of CZTS single phase crystals with a nearly stoichiometric chemical composition. The carrier concentration, mobility, and resistivity of the crystals are determined from Hall Effect measurements. At room temperature, the respective values are found to be 4.0 × 1015 cm?3, 1.0 cm2 Vs?1, and 1540 ? cm. The activation energies for the acceptor levels are also determined using the temperature-dependent hole concentration measurement. CuZn-antisite originated acceptor level with activation energies of ?121 meV is identified in a nearly stoichiometric kesterite structure. © 2021 Wiley-VCH GmbH
Description
Keywords
conductivity, Cu2ZnSnS4, mobility, Activation energy, Chemical analysis, Copper compounds, Crystal structure, Energy dispersive X ray analysis, Hall mobility, Hole concentration, Tin compounds, X ray diffraction analysis, Acceptor levels, Bridgman techniques, Conductivity, Kesterites, Mobility, Single phasis, Single zones, Vertical Bridgman technique, Vertical furnaces, X- ray diffractions, Zinc compounds
Journal or Series
Physica Status Solidi (A) Applications and Materials Science
WoS Q Value
Q3
Scopus Q Value
Q2
Volume
219
Issue
3