Investigation of structural, electrical and linear/non-linear optical properties of MgPc thin films grown by CSP technique for optoelectronic applications

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dc.authoridTatar, Beyhan/0000-0003-3463-2009
dc.contributor.authorTatar, B.
dc.contributor.authorGezeroglu, B.
dc.date.accessioned2024-10-29T17:58:19Z
dc.date.available2024-10-29T17:58:19Z
dc.date.issued2024
dc.departmentTekirdağ Namık Kemal Üniversitesi
dc.description.abstractOrganic semiconductor MgPc thin films were grown onto n-Si, p-Si and corning glass substrates by Chemical Spray Pyrolysis (CSP) technique. The structural and surface morphological properties of MgPc thin films were investigated by XRD, RAMAN and FEG-SEM analysis. It was observed that the surface area on which MgPc thin films grow on n-Si and p-Si substrates were dendritic nanostructures and has homogeneous surface morphology. XRD patterns showed us that all organic semiconductor MgPc thin films have monoclinic alpha-phase structure with 2 theta peak at - 7.8 degrees which is 100%. X-ray diffraction and grain sizes measurements of MgPc thin films indicated that organic semiconductor MgPc thin films have nanocrystalline nature. We observed 25 Raman active peaks belonging to MgPc thin films. The diode parameters of p-MgPc/n-Si and p-MgPc/p-Si which are organic-inorganic hybrid heterojunctions have been investigated by current-voltage (I-V) measurements at room temperature in dark condition. The linear & non-linear optical properties of MgPc thin films growth on corning glass substrate were determined from transmittance and reflectance measurements. The optical bandgap of the organic MgPc semiconductor was found as 1.91 eV. The linear and nonlinear optical parameters of the organic MgPc thin film were investigated to determine the potential for use in optoelectronic applications.
dc.identifier.doi10.1007/s10854-023-11850-4
dc.identifier.issn0957-4522
dc.identifier.issn1573-482X
dc.identifier.issue1en_US
dc.identifier.scopus2-s2.0-85180826099
dc.identifier.scopusqualityQ2
dc.identifier.urihttps://doi.org/10.1007/s10854-023-11850-4
dc.identifier.urihttps://hdl.handle.net/20.500.11776/14230
dc.identifier.volume35
dc.identifier.wosWOS:001132266500004
dc.identifier.wosqualityN/A
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherSpringer
dc.relation.ispartofJournal of Materials Science-Materials in Electronics
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.subjectMagnesium Phthalocyanine
dc.subjectRefractive-Index
dc.subjectPhotovoltaic Properties
dc.subjectSi
dc.subjectSpectroscopy
dc.titleInvestigation of structural, electrical and linear/non-linear optical properties of MgPc thin films grown by CSP technique for optoelectronic applications
dc.typeArticle

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