Yazar "Özdemir, Orhan" için listeleme
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Alternative approach for determination of energy band gap of semiconductors through electrical analysis
Özdemir, Orhan; Tatar, Beyhan; Yılmazer, Deneb; Gökdemir, Pınar; Ürgen, Mustafa; Kutlu, Kubilay (2010)Traditional way of extracting energy band gap (EG) of semiconductors from UV-Visible transmisson measurement becomes difficult once EG lies below than 1 eV. Instead of optical excitation of electrons from valance to ... -
Correlation of DC and AC electrical properties of Al/p-Si structure by I-V-T and C(G/omega)-V-T measurements
Özdemir, Orhan; Tatar, Beyhan; Yılmazer, Deneb; Gökdemir, Pınar; Kutlu, Kubilay (Elsevier Sci Ltd, 2009)Current-voltage-temperature and admittance-gate bias-temperature measurements were performed on Al/p-Si structure to investigate transport and storage properties. In forward direction of former measurement, three distinct ... -
Excess Capacitance Due to Minority Carrier Injection in CrSi2/p-Type Crystalline Si Isotype Junction
Özdemir, Orhan; Yılmazer, Deneb; Tatar, Beyhan; Ürgen, Mustafa; Kutlu, Kubilay (Iop Publishing Ltd, 2010)Excess current and capacitance phenonema were observed for the first time on a CrSi2/p-type crystalline silicon junction produced by cathodic arc physical vapor deposition. The heterojunction was investigated by ... -
Transport and storage properties of CrSi2/Si junctions made using the CAPVD technique
Menda, Ugur Deneb; Özdemir, Orhan; Tatar, Beyhan; Ürgen, Mustafa; Kutlu, Kubilay (Elsevier Sci Ltd, 2010)p-CrSi2/n-crystSi and p-CrSi2/p-crystSi hetero junctions produced by cathodic arc physical vapor deposition were worked out by means of capacitance-voltage-temperature (C-V-T) and current-voltage-temperature (I-V-T) ...