Ara
Toplam kayıt 83, listelenen: 21-30
Illumination and voltage effects on the forward and reverse bias current-voltage (I-V) characteristics in In/In2S3/p-Si photodiodes
(Springer, 2021)
The illumination and voltage effects on the I-V measurements of the fabricated In/In2S3/p-Si photodiode were investigated in dark and under various illumination intensities (20–100 mW/cm2) between ± 2 V. Two linear regions ...
Growth and Characterization of Stoichiometric Cu2ZnSnS4 Crystal Using Vertical Bridgman Technique
(John Wiley and Sons Inc, 2022)
Stoichiometric Cu2ZnSnS4 (CZTS) single phase crystals are successfully grown in a single-zone vertical furnace by Bridgman technique. X-ray diffraction (XRD) and Raman spectroscopy measurements are employed to investigate ...
Optical and structural characteristics of electrodeposited Cd 1-xZnxS nanostructured thin films
(Elsevier B.V., 2021)
The structural and optical characteristics of Cd1-xZnxS (CdZnS) thin films grown by the electrodeposition method were investigated in the present paper. The crystalline structure of the grown CdZnS thin film was determined ...
The effect of Zn concentration on the structural and optical properties of Cd1-xZnxS nanostructured thin films
(Springer, 2021)
The structural and optical properties of electrodeposited Cd1-xZnxS nanostructured thin films were investigated in the present paper for compositions of x = 0, 0.03, 0.06 and 0.09. X-ray diffraction patterns of the deposited ...
Temperature-dependent optical characteristics of sputtered NiO thin films
(Springer Science and Business Media Deutschland GmbH, 2022)
In this work, nickel oxide thin films were deposited by radio frequency magnetron sputtering technique. X-ray diffraction (XRD), scanning electron microscopy and energy-dispersive X-ray analysis methods were applied to ...
Quantitative phase imaging of thin film surface
(Polska Akademia Nauk, 2021)
In this study, the white light diffraction phase microscopy and the generalized Morse wavelet are proposed to achieve practical and precise measurement of a thin film surface. The white light diffraction phase microscopy ...
Structural and temperature-tuned bandgap characteristics of thermally evaporated beta-In2S3 thin films
(Springer, 2021)
In2S3 is one of the attractive compounds taking remarkable interest in optoelectronic device applications. The present study reports the structural and optical characteristics of thermally evaporated beta-In2S3 thin films. ...
The Importance of Examining Antinuclear Antibody (Ana) in Neurological Diseases
(Nobel Ilac, 2013)
Objective: In neurological clinical practice screening test for ANA (Anti-nuclear antibody) is helpful in the diagnosis of autoimmune diseases which have neurological involvement. ANA investigation tests might be positive ...
Variant Analysis of the Sirtuin (SIRT1) Gene in Multiple Sclerosis
(Kuwait Medical Assoc, 2013)
Objective: Multiple sclerosis (MS) is an inflammatory demyelinating disease affecting the central nervous system. Although the exact pathogenesis of MS is unknown, it is generally considered to be an autoimmune disease, ...
Deposition of CZTSe thin films and illumination effects on the device properties of Ag/n-Si/p-CZTSe/In heterostructure
(Elsevier Science Sa, 2017)
Characterization of Cu2ZnSnSe4 (CZTSe) thin films deposited by thermal evaporation sequentially from the pure elemental sources and in-situ post annealing was carried out at 400 C under Se evaporation atmosphere. Another ...