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dc.contributor.authorSarıca, Emrah
dc.contributor.authorGüneş, İbrahim
dc.contributor.authorAkyüz, İdris
dc.contributor.authorBilgin, Vildan
dc.contributor.authorErtürk, Kadir
dc.date.accessioned2022-05-11T14:03:20Z
dc.date.available2022-05-11T14:03:20Z
dc.date.issued2021
dc.identifier.issn0925-3467
dc.identifier.urihttps://doi.org/10.1016/j.optmat.2021.111283
dc.identifier.urihttps://hdl.handle.net/20.500.11776/4674
dc.description.abstractIn this work ZnO:Sn thin films were deposited onto glass and p-Si substrates by spin coating of prepared sols which contains different amounts of Zn(CH3COO)2·2H2O and SnCl2 (0, 5, 10 and 15%). Physical properties of ZnO films were examined as a function of SnCl2 in prepared sols. In addition to that, heterostructure examinations were also carried out by depositing all films on p-Si substrates as well. XRD studies revealed that all films have c-axis orientation with crystallite sizes between 38 and 47 nm. AFM and SEM images showed that morphology of the films remarkably deteriorated with the increase in amount of SnCl2 in sol. Optical transmittance and absorbance spectra showed that films have high transmittance and low absorbance in the visible region. Besides, optical band gap increased from 3.27 eV to 3.37 eV. Additional band gap energies were determined for 10% and 15% Sn doped ZnO films. Room temperature photoluminescence spectra for all films were deconvoluted for the evaluation of all emission bands and it was noted that incorporation of SnCl2 into sol led to enhancement of UV-blue emission bands and caused emission bands related to oxygen vacancies to diminish. Four-point-probe measurements revealed that electrical resistivity of ZnO:Sn films increased from 3.20 × 100 ?cm to 2.82 × 104 ?cm and diode ideality factor of Ag/ZnO:Sn/p-Si/Au heterostructure was calculated to be in the range of 2.14–4.59 while zero-bias barrier height is in the range of 0.63–0.78 eV. © 2021 Elsevier B.V.en_US
dc.description.sponsorship182N19en_US
dc.description.sponsorshipThis work was supported by the Bursa Technical University Scientific Research Projects Committee under the project number 182N19.en_US
dc.language.isoengen_US
dc.publisherElsevier B.V.en_US
dc.identifier.doi10.1016/j.optmat.2021.111283
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAg/ZnO:Sn/Si/Auen_US
dc.subjectPhotoluminescenceen_US
dc.subjectSpin coatingen_US
dc.subjectThermionic emissionen_US
dc.subjectTin dopingen_US
dc.subjectZinc oxideen_US
dc.subjectChlorine compoundsen_US
dc.subjectConductive filmsen_US
dc.subjectCrystallite sizeen_US
dc.subjectEnergy gapen_US
dc.subjectFilm preparationen_US
dc.subjectMetallic filmsen_US
dc.subjectMorphologyen_US
dc.subjectOptical filmsen_US
dc.subjectOxide filmsen_US
dc.subjectPhotoluminescenceen_US
dc.subjectSemiconductor dopingen_US
dc.subjectSilicon compoundsen_US
dc.subjectSol-gel processen_US
dc.subjectSpin coatingen_US
dc.subjectSpin glassen_US
dc.subjectThermionic emissionen_US
dc.subjectThin filmsen_US
dc.subjectTin oxidesen_US
dc.subjectZinc coatingsen_US
dc.subjectZinc oxideen_US
dc.subjectAg/ZnO:sn/si/auen_US
dc.subjectEmission bandsen_US
dc.subjectPropertyen_US
dc.subjectSi substratesen_US
dc.subjectSol'gelen_US
dc.subjectThin-filmsen_US
dc.subjectTin dopingen_US
dc.subjectXRD studiesen_US
dc.subjectZnOen_US
dc.subjectZnO filmsen_US
dc.subjectII-VI semiconductorsen_US
dc.titleSol-gel derived ZnO:Sn thin films and fabrication of n-ZnO:Sn/p-Si heterostructureen_US
dc.typearticleen_US
dc.relation.ispartofOptical Materialsen_US
dc.departmentFakülteler, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.identifier.volume118en_US
dc.institutionauthorErtürk, Kadir
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.authorscopusid54913094300
dc.authorscopusid15049656000
dc.authorscopusid6508101272
dc.authorscopusid56627311400
dc.authorscopusid18036952100
dc.identifier.wosWOS:000674489500005en_US
dc.identifier.scopus2-s2.0-85107737387en_US


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