Konu "II-VI semiconductors" için Fakülteler listeleme
Toplam kayıt 10, listelenen: 1-10
-
Characterization of CdS films and CdS/Si heterojunctions prepared by ultrasonic spray pyrolysis and their response to light
(Elsevier B.V., 2020)In this work CdS thin films were deposited onto glass and p-Si substrates by ultrasonically spraying of precursor solutions prepared in molarity ranging from 0.025 M, to 0.1 M. Structural investigations revealed that all ... -
Construction of self-assembled vertical nanoflakes on CZTSSe thin films
(Institute of Physics Publishing, 2019)Cu2ZnSn(S, Se)4 (CZTSSe) is a promising alternative absorber material to achieve high power conversion efficiencies, besides its property of involving low-cost and earth-abundant elements when compared to Cu(In, Ga)Se2 ... -
CZTSSe thin films fabricated by single step deposition for superstrate solar cell applications
(Springer New York LLC, 2019)The focus of this study is the characterization of Cu2ZnSn(S,Se)4 (CZTSSe) thin films and fabrication of CZTSSe solar cell in superstrate configuration. In this work, superstrate-type configuration of glass/ITO/CdS/CZTSSe/Au ... -
Electrical characterization of CdZnTe/Si diode structure
(Springer, 2020)Temperature-dependent current-voltage (I- V) , and frequency dependent capacitance-voltage (C- V) and conductance-voltage (G- V) measurements were performed in order to analyze characteristics of CdZnTe/Si structure. ... -
Investigation of electrical characteristics of Ag/ZnO/Si sandwich structure
(Springer New York LLC, 2019)In this study, temperature-dependent current–voltage (I–V), frequency-dependent capacitance–voltage (C–V) and conductance–voltage (G/ ?- V) measurements are carried out for the electrical characterization of a zinc oxide ... -
Material and Si-based diode analyses of sputtered ZnTe thin films
(Springer, 2020)Structural, optical, and electrical properties ZnTe thin films grown by magnetron sputtering technique were studied by X-ray diffraction, atomic force microscopy, Raman spectroscopy, and electrical conductivity measurements. ... -
Optical and structural characteristics of electrodeposited Cd 1-xZnxS nanostructured thin films
(Elsevier B.V., 2021)The structural and optical characteristics of Cd1-xZnxS (CdZnS) thin films grown by the electrodeposition method were investigated in the present paper. The crystalline structure of the grown CdZnS thin film was determined ... -
Sol-gel derived ZnO:Sn thin films and fabrication of n-ZnO:Sn/p-Si heterostructure
(Elsevier B.V., 2021)In this work ZnO:Sn thin films were deposited onto glass and p-Si substrates by spin coating of prepared sols which contains different amounts of Zn(CH3COO)2·2H2O and SnCl2 (0, 5, 10 and 15%). Physical properties of ZnO ... -
Temperature-dependent material characterization of CuZnSe2 thin films
(Elsevier B.V., 2020)In the present work, CuZnSe2 (CZSe) thin films were co-deposited by magnetron sputtering of ZnSe and Cu targets. The structural analyses resulted in the stoichiometric elemental composition and polycrystalline nature without ... -
The zero order generalized Morse wavelet method to determine the refractive index and extinction coefficient dispersions of an absorbing film
(Elsevier B.V., 2019)The zero order generalized Morse wavelet was proposed as a method to determine the refractive index and extinction coefficient dispersions of an absorbing thin film in the visible and near infrared regions at room temperature. ...