ORCID "0000-0002-9791-3206" Fakülteler için listeleme
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3D Profile Measurements of Objects by Using Zero Order Generalized Morse Wavelet
Koçahan, Özlem; Durmuş, Çagla; Elmas, Merve Naz; Coşkun, Emre; Tiryaki, Erhan; Özder, Serhat (Amer Inst Physics, 2017)Generalized Morse wavelets are proposed to evaluate the phase information from projected fringe pattern with the spatial carrier frequency in the x direction. The height profile of the object is determined through the phase ... -
Determination of phase from the ridge of CWT using generalized Morse wavelet
Koçahan, Özlem; Tiryaki, Erhan; Coşkun, Emre; Özder, Serhat (Iop Publishing Ltd, 2018)The selection of wavelet is an important step in order to determine the phase from the fringe patterns. In the present work, a new wavelet for phase retrieval from the ridge of continuous wavelet transform (CWT) is presented. ... -
An Improved Method for Determination of Refractive Index of Dielectric Films from Reflectance Spectrum by Using the Generalized Morse Wavelet
Tiryaki, Erhan; Koçahan, Özlem; Özder, Serhat (Sciendo, 2021)The Generalized Morse Wavelet (GMW) algorithm was adapted to determine the refractive index of dielectric film from the reflectance spectrum. A theoretically generated reflectance spectrum in the range of 300-1200 nm ... -
Optical Phase Distribution Evaluation by Using Zero Order Generalized Morse Wavelet
Koçahan, Özlem; Elmas, Merve Naz; Durmuş, Çagla; Coşkun, Emre; Tiryaki, Erhan; Özder, Serhat (Amer Inst Physics, 2017)When determining the phase from the projected fringes by using continuous wavelet transform (CWT), selection of wavelet is an important step. A new wavelet for phase retrieval from the fringe pattern with the spatial carrier ... -
A Simulation Study for Determination of Refractive Index Dispersion of Dielectric Film from Reflectance Spectrum by Using Paul Wavelet
Tiryaki, Erhan; Coşkun, Emre; Koçahan, Özlem; Özder, Serhat (Amer Inst Physics, 2017)In this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film The reflectance ...