Özcan, SeçkinCoşkun, EmreKoçahan, ÖzlemÖzder, Serhat2022-05-112022-05-1120190040-6090https://doi.org/10.1016/j.tsf.2019.137602https://hdl.handle.net/20.500.11776/4656The continuous wavelet transform with Paul wavelet was proposed as a method for the simultaneous determination of physical thickness and refractive index dispersion of dielectric films in the visible and near infrared region. Transmittance spectrums, acquired at two different incident angles, were used for the calculations. By this way refractive index dispersion was obtained without knowing the film thickness. The method was tested with simulated data and experimentally applied to a sample of borosilicate glass. The obtained thickness and refractive index dispersion values were compared to the values obtained by the envelope method and the ones provided by the manufacturer. © 2019 Elsevier B.V.en10.1016/j.tsf.2019.137602info:eu-repo/semantics/closedAccessDielectric filmsPhysical thicknessRefractive index dispersionTransmittance spectrumBorosilicate glassDielectric filmsDispersion (waves)Infrared devicesWavelet transformsContinuous Wavelet TransformEnvelope methodPhysical thicknessRefractive index dispersionSimultaneous determinationsTransmittance spectraTransmittance spectrumVisible and near infraredRefractive indexArticle692Q3WOS:0004996787000432-s2.0-85073959167Q2