Tiryaki, ErhanCoşkun, EmreKoçahan, ÖzlemÖzder, Serhat2022-05-112022-05-112017978-0-7354-1483-90094-243Xhttps://doi.org/10.1063/1.4976392https://hdl.handle.net/20.500.11776/702532nd International Physics Congress of Turkish-Physical-Society (TPS) -- SEP 06-09, 2016 -- Bodrum, TURKEYIn this work, the Continuous Wavelet Transform (CWT) with Paul wavelet was improved as a tool for determination of refractive index dispersion of dielectric film by using the reflectance spectrum of the film The reflectance spectrum was generated theoretically in the range of 0.8333 - 3.3333 mu m wavenumber and it was analyzed with presented method. Obtained refractive index determined from various resolution of Paul wavelet were compared with the input values, and the importance of the tunable resolution with Paul wavelet was discussed briefly. The noise immunity and uncertainty of the method was also studied.en10.1063/1.4976392info:eu-repo/semantics/closedAccessOptical-ConstantsThicknessConference Object1815N/AWOS:0004352051000482-s2.0-85016000063N/A