Işık, M.Terlemezoğlu, MakbuleGasanly, N.Parlak, M.2023-04-202023-04-2020221386-9477https://doi.org/10.1016/j.physe.2022.115407https://hdl.handle.net/20.500.11776/11127Copper sulfide (CuS) thin films were produced by radio-frequency (RF) magnetron sputtering method. Structural, morphological and optical characteristics of deposited CuS films were presented. X-ray diffraction pattern showed two intensive peaks associated with hexagonal crystalline structure. Scanning electron microscopy image indicated that CuS films have nano-flake structured. Raman spectrum was reported to show vibrational characteristics of the CuS nano-flake thin films. Two peaks associated with Cu–S and S–S vibrations were observed in the Raman spectrum. Transmission spectra were recorded at various temperatures between 10 and 300 K. The analyses accomplished considering Tauc expression demonstrated that direct bandgap energy decreases from 2.36 eV (at 10 K) to 2.22 eV (at 300 K). Temperature-bandgap dependency was analyzed considering Varshni and Bose-Einstein expressions to reveal bandgap at 0 K, rate of change of bandgap and Debye temperature. CuS nanoflake thin film may be used in optoelectronic and photocatalysis applications thanks to its direct and narrow bandgap energy characteristics. © 2022 Elsevier B.V.en10.1016/j.physe.2022.115407info:eu-repo/semantics/closedAccessCopper sulfideNanoflakeOptical propertiesOptoelectronic applicationsCopper compoundsEnergy gapMagnetron sputteringOptical filmsRaman scatteringScanning electron microscopyStatistical mechanicsSulfur compoundsThin filmsBand gap energyMorphological characteristicNano-flakesOptical characteristicsOptoelectronic applicationsRadio frequency magnetron sputtering methodStructural characteristicsTemperature tunedThin-filmsX ray diffraction patternsOptical propertiesArticle144Q2WOS:0009108647000062-s2.0-85134212755Q2